Low-noise ADC multifunctional time-frequency parameter comprehensive tester

The utility model discloses a multifunctional time-frequency parameter comprehensive tester for a low-noise ADC (Analog to Digital Converter), which comprises a sampling clock circuit, a power supply reference circuit, a single-ended to differential conversion circuit, a digital output buffer circuit and a low-noise ADC sampling circuit, and is characterized in that the sampling clock circuit carries out differential processing on a received clock signal and outputs the processed signal to the low-noise ADC sampling circuit; the power supply reference circuit is used for generating a high-precision voltage reference to the low-noise ADC sampling circuit, the single-ended to differential conversion circuit is used for performing matching conversion on an input signal and outputting the input signal to the low-noise ADC sampling circuit, and the digital output buffer circuit is used for performing level conversion on a data interface of the low-noise ADC sampling circuit; according to the utility model, short-t