Testing device for temperature coefficients of chip current sensor and low-resistance resistor

The utility model provides a temperature coefficient testing device for a chip current sensor and a low-resistance resistor, which comprises a product fixing pressure plate, a pressure plate, a limiting plate, two support plates, copper electrodes, wiring terminals, threaded holes and a support substrate, the upper end of the support substrate is fixedly connected with the support plates through positioning pins; a concave groove is formed between the two supporting plates, the upper ends of the supporting plates are fixedly connected with limiting plates, rectangular grooves are formed in the opposite sides of the two limiting plates, the upper ends of the limiting plates are fixedly connected with pressing plates, and the two ends of the product fixing pressing plates penetrate through screws and then are connected with threaded holes in supporting base plates through threads. A copper electrode is fixedly installed in a gap between the supporting plate and the limiting plate, and a wiring terminal is insta