Withstand voltage test device of discrete semiconductor device

The utility model discloses a semiconductor discrete device withstand voltage test device, comprising a test box and a test mechanism, the inner wall of the test box is fixedly connected with a fixed column, the fixed column is internally provided with a cavity, the inner wall of the fixed column is rotatably connected with a rotating rod, the right end of the rotating rod is fixedly connected with a first helical gear, and the right end of the rotating rod is fixedly connected with a second helical gear. The first bevel gear is connected with a second bevel gear in an engaged mode. According to the utility model, the second helical gear can be driven to rotate through the handle, the rotating rod and the first helical gear, the second helical gear can drive the thread bushing to move oppositely through the worm, the worm gear and the bidirectional threaded rod, and the thread bushing can drive the two pin insertion blocks to move through the pull rod. Therefore, the distance between the two pin insertion blo