Sampling inspection device for chip manufacturing

The utility model discloses a sampling inspection device for chip manufacturing, which belongs to the technical field of chip production, and comprises a bottom plate, a box body, a detection needle, a transmission assembly, a fault display lamp, a positioning box, a cylinder, a placing plate, a spring II, a fan, a starting plate and a starting assembly, according to the utility model, the air cylinder drives the detection needle to be inserted into the placing plate, the detection needle drives the placing plate to move downwards, and the placing plate drives the starting assembly to be in contact with the starting plate, so that the fan can be started to rotate and dissipate heat, heat dissipation is realized while detection is carried out, and after detection is finished, the fan can be started to rotate to dissipate heat. The placing plate is reset under the action of the second spring, heat dissipation is finished, and energy is saved; in addition, the placement plate can be buffered by arranging a sprin