Limiting column based on semiconductor test

The utility model discloses a limiting column based on a semiconductor test. The limiting column comprises a limiting column body, a buffer member and a damping assembly. One end of the buffer piece is in contact with a butt joint plate, and the other end of the buffer piece penetrates through the middle of the limiting column body and extends to the outside of the limiting column body; the damping assembly is arranged on the outer wall of the limiting column body and hinged to the end, away from the butt joint plate, of the buffering piece. When the buffering piece slides under the impact force of the butt joint plate, the damping assembly is pulled to make contact with the outer wall of the butt joint plate. Through the cooperative use of the devices, the movement speed of the butt joint plate is reduced, so that the impact force of the butt joint plate on the limiting column body is reduced, and the purpose of protecting the limiting column body and the butt joint plate is achieved. 本实用新型揭示了一种基于半导体测试的限位柱，包