Detection instrument for silicon material quality analysis
The utility model discloses a detection instrument for silicon material quality analysis, which comprises a detection instrument body, a placement table is rotatably mounted in the detection instrument body, a pressure plate is slidably connected to the upper part of the placement table, a leakage-p...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses a detection instrument for silicon material quality analysis, which comprises a detection instrument body, a placement table is rotatably mounted in the detection instrument body, a pressure plate is slidably connected to the upper part of the placement table, a leakage-proof assembly is arranged at the lower part of the pressure plate and comprises a sealing plate, and the sealing plate is movably mounted at the lower part of the pressure plate through a spring. One side of the sealing plate is fixedly connected with a movable rod, one end, away from the sealing plate, of the movable rod is in contact with a triangular plate, the triangular plate is fixedly connected inside the detector body, and the sealing plate moves through the movable rod in contact with the triangular plate. A sealing plate is movably installed on the lower portion of a pressing disc through a spring, a movable rod is fixedly connected to one side of the sealing plate, a triangular plate is in contact with t |
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