DAS sensing system for preventing PIN tube from being damaged by using two-section cascaded EDFA

The utility model discloses a DAS sensing system using two cascaded EDFAs to avoid PIN tube damage, which comprises an input end input, a semiconductor laser LD, a first ultra-long-distance wavelength division multiplexer WDM1 and a first erbium-doped fiber EDF1, the input end input is connected wit...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	XIA JIANGZHEN, LIU JIN, ZHANG XIAORAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS BASIC ELECTRIC ELEMENTS DEVICES USING STIMULATED EMISSION ELECTRICITY MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	The utility model discloses a DAS sensing system using two cascaded EDFAs to avoid PIN tube damage, which comprises an input end input, a semiconductor laser LD, a first ultra-long-distance wavelength division multiplexer WDM1 and a first erbium-doped fiber EDF1, the input end input is connected with the first ultra-long-distance wavelength division multiplexer WDM1 through an optical fiber, and the first erbium-doped fiber EDF1 is connected with the first ultra-long-distance wavelength division multiplexer WDM1 through an optical fiber. The first ultra-long-distance wavelength division multiplexer WDM1 is connected with the semiconductor laser LD through an optical fiber, the first ultra-long-distance wavelength division multiplexer WDM1 is connected with the second ultra-long-distance wavelength division multiplexer WDM2 through an optical fiber, and an erbium-doped fiber EDF1 is arranged between the first ultra-long-distance wavelength division multiplexer WDM1 and the second ultra-long-distance wavelength