High-performance analog-to-digital conversion performance test platform

The utility model belongs to the technical field of performance testing, and particularly relates to a high-performance analog-to-digital conversion performance testing platform which comprises a shell, a plurality of input interfaces used for being connected with testing cards are formed in the fro...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUN JIA, LIU HENGLIANG, PU DESHENG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The utility model belongs to the technical field of performance testing, and particularly relates to a high-performance analog-to-digital conversion performance testing platform which comprises a shell, a plurality of input interfaces used for being connected with testing cards are formed in the front end face of the shell, and indicator lamps used for displaying testing states are arranged above the input interfaces. A control switch for controlling the test switch is arranged at one end of the front end surface of the shell; the shell is internally provided with an FPGA processing module, a DSP processing module and a clock module, the output end of the input interface is connected with the FPGA processing module, the FPGA processing module is electrically connected with the DSP processing module through an SRIO interface, the clock module is respectively connected with the FPGA processing module and the DSP processing module, and the output end of the DSP processing module is electrically connected with an