Chip table for electric displacement test bench
The utility model relates to a chip bench used for an electric displacement test bench, comprising a heat conduction positioning block and a semiconductor chilling plate, the upper end of the heat conduction positioning block is provided with a chip positioning bench surface used for positioning a c...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model relates to a chip bench used for an electric displacement test bench, comprising a heat conduction positioning block and a semiconductor chilling plate, the upper end of the heat conduction positioning block is provided with a chip positioning bench surface used for positioning a chip, the heat conduction positioning block is fixed on the upper end of the semiconductor chilling plate, the semiconductor chilling plate is fixed on a support, and the support is fixed on the chip positioning bench surface. The support is fixed to the moving mechanism, and a heat dissipation module is fixed to the lower end of the semiconductor chilling plate. The chip bench for the electric displacement test bench can adjust the position of the chip and control the temperature of the chip at the same time.
本实用新型涉及一种电动位移测试台用芯片台,包括导热定位块、半导体制冷片,所述导热定位块上端设有用于对芯片进行定位的芯片定位台面,所述导热定位块固定在半导体制冷片的上端,所述半导体制冷片固定在支座上,所述支座固定在移动机构上,所述半导体制冷片的下端固定有散热模组。本实用新型的电动位移测试台用芯片台可以对芯片进行位置调整的同时实现对芯片温度进行控制。 |
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