Axial semiconductor three-temperature testing device

The utility model provides an axial semiconductor three-temperature testing device. The axial semiconductor three-temperature testing device comprises a box body, a box cover and a temperature measuring clamp, the box cover is movably installed on the box body, the temperature measuring clamp extends into the box body from the box cover to carry out temperature testing on components in the box body, and heat preservation structures are arranged in the box body and the box cover. According to the utility model, the temperature difference when the semiconductor chip is tested is reduced through the thermal insulation function of the test box, and the guide groove on the box body is utilized, so that a test worker can accurately make the probe contact with the semiconductor lead. 本实用新型提供了一种轴向半导体三温测试装置，包括盒体、盒盖、测温夹；所述盒盖活动安装在盒体上，所述测温夹从盒盖上伸入盒体内对盒体内的元器件进行温度测试，所述盒体和盒盖内均设置有保温结构。本实用新型通过测试盒的保温功能降低了半导体芯片被测试时的温度差异，利用盒体上的导向槽，是测试工人能够准确的将探针接触到半导体引线上。