X-ray light source calibration device for X-ray scattering test system
The utility model discloses an X-ray light source calibration device for an X-ray scattering test system, which comprises a base, the upper part of the base is provided with a light source calibration mechanism, and the light source calibration mechanism comprises an inclination angle adjusting asse...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses an X-ray light source calibration device for an X-ray scattering test system, which comprises a base, the upper part of the base is provided with a light source calibration mechanism, and the light source calibration mechanism comprises an inclination angle adjusting assembly, a height adjusting assembly and a distance adjusting assembly. The inclination angle adjusting assembly, the height adjusting assembly and the interval adjusting assembly are sequentially stacked from bottom to top, a controller is arranged on one side of the base, and the controller is connected with an upper computer of the test system. The height and levelness of the X-ray light source and the distance between the X-ray light source and a rear device can be adjusted through the light source calibration mechanism.
本实用新型公开了一种用于X射线散射测试系统的X射线光源校准装置,包括底座,所述底座上部设置有光源校准机构,所述光源校准机构包括倾角调节组件、高度调节组件和间距调节组件,所述倾角调节组件、高度调节组件和间距调节组件从下到上依次堆叠设置,所述底座的一侧设置有控制器,所述控制器与测试系统的上位机连接。本实用新型通过光源校准机构可以用于调节X射线光源的高度、水平度以及与后部装置距离。 |
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