Semiconductor assembly testing device

The utility model belongs to the technical field of semiconductor assembly testing, and particularly relates to a semiconductor assembly testing device which comprises a base, a clamping assembly and a detection assembly, the clamping assembly comprises an electric telescopic rod, the output end of...

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1. Verfasser: DU HAOCHEN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The utility model belongs to the technical field of semiconductor assembly testing, and particularly relates to a semiconductor assembly testing device which comprises a base, a clamping assembly and a detection assembly, the clamping assembly comprises an electric telescopic rod, the output end of the electric telescopic rod is provided with a clamping plate, and the inner side wall of the clamping plate is provided with a clamping groove. The control button and the light sensor are in electrical input connection with the controller, and the controller is in electrical input connection with the electric telescopic rod, so that the detected semiconductor assembly can be fixed, and the situation that the semiconductor assembly displaces in the testing process, and consequently the testing effect is poor is prevented. 本实用新型公开的属于半导体组件测试技术领域,具体为一种半导体组件测试装置,包括底座、夹持组件和检测组件,通过夹持组件包括有电动伸缩杆,电动伸缩杆输出端安装有夹持板,夹持板内侧壁上开设有夹持槽,控制按钮和光感传感器电性输入连接控制器,控制器电性输入连接电动伸缩杆,可以对检测半导体组件进行固定,防止测试过程中半导体组件发生位移,造成测试效果不佳。