Chip test probe device

The utility model discloses a chip test probe device, which comprises a base, a top plate, a lifting plate and a motor arranged on the base, a lead screw is arranged on the motor, a guide rail is arranged on the base, a sliding seat is clamped in the guide rail in a sliding manner, a guide ball and a buffer cavity are arranged on the sliding seat, a buffer seat and a buffer spring are arranged in the buffer cavity, and an IPT cap rod is arranged on the buffer seat. A chip is arranged on the IPT cap rod, a mounting block is arranged on the lifting plate, a locking pin and a probe circuit board are arranged on the mounting block, and a test probe is arranged on the probe circuit board. The movement smoothness and the anti-falling performance of the whole sliding seat and the IPT cap rod with the chip in the guide rail are improved, effective buffering and force unloading protection of the chip on the downward pressing jacking force of the test probe can be achieved, and the situation that the chip is crushed du