Anti-interference coating thickness measuring device based on X-ray

The utility modelprovides an anti-interference coating thickness measuring device based on X-rays. The anti-interference coating thickness measuring device comprises a device body, a driving mechanism is connected to the upper portion of the device body, a rolling mechanism is connected to the interior of the device body, and a thickness measuring mechanism is connected to the inner side of the driving mechanism. Through the thickness measuring mechanism and the wave absorbing plate which is arranged in the thickness measuring mechanism and forms an integrated structure with the supporting plate, an external signal can be prevented from interfering with an X-ray emitted by the X-ray emitter, and the stability of the X-ray on coating measurement is ensured, so that the anti-interference effect is achieved, the measurement of the device is more accurate, and the measurement efficiency is improved. Through a linkage structure formed by a rotating wheel and a rolling wheel in the rolling mechanism, a material nee