IC testing and sorting equipment
The utility model discloses IC (integrated circuit) testing and sorting equipment, which comprises a main frame, the feeder structure comprises at least one feeder component; the feeder component is located on the main machine frame. The shuttling area is used for receiving the products transferred...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses IC (integrated circuit) testing and sorting equipment, which comprises a main frame, the feeder structure comprises at least one feeder component; the feeder component is located on the main machine frame. The shuttling area is used for receiving the products transferred from the feeder component; and the feeding and transferring device comprises a driving part and at least two adsorption parts, the adsorption parts are adjustably connected to the driving part, and the driving part can drive the adsorption parts to move to a feeder part so that the placed products can be adsorbed to the shuttling area. According to the technical scheme, the adsorption device is high in structural stability, suitable for adsorption of more products placed at different intervals, capable of feeding and sorting more different types of products and high in working efficiency.
本实用新型公开一种IC测试分选设备,包括:主机架;上料器结构,所述上料器结构包括至少一个上料器部件;所述上料器部件位于所述主机架上;穿梭区,所述穿梭区用于承接从所述上料器部件中转移的产品;上料移载装置,所述上料移载装置包括驱动件和至少两个吸附件,所述吸附件 |
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