Deposition apparatus and deposition system
Deposition apparatuses and deposition systems are described. The deposition apparatus comprises: a vacuum chamber sized to accommodate a GEN 2-generation or higher rectangular large area substrate; and an array of deposition sources having at least a first deposition source, a second deposition sour...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | LINDENBERG RALPH |
description | Deposition apparatuses and deposition systems are described. The deposition apparatus comprises: a vacuum chamber sized to accommodate a GEN 2-generation or higher rectangular large area substrate; and an array of deposition sources having at least a first deposition source, a second deposition source, and a third deposition source, the first, second, and third deposition sources having a target pitch in a first direction, the array of deposition sources configured to deposit a material in a processing region in the vacuum chamber in a static deposition process, wherein a ratio of the deposition source pitch to the deposition source size in the first direction is 1.8 or more.
描述了沉积设备和沉积系统。所述沉积设备包括:真空腔室,所述真空腔室定大小为适于容纳GEN 2代或更高世代的矩形大面积基板;和沉积源阵列,所述沉积源阵列具有至少第一沉积源、第二沉积源和第三沉积源,所述第一沉积源、第二沉积源和第三沉积源具有在第一方向上的靶节距,所述沉积源阵列被构造为在静态沉积工艺中在真空腔室中的处理区域中沉积材料,其中在所述第一方向上沉积源节距与沉积源尺寸的比率为1.8或更大。 |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN215163072UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN215163072UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN215163072UU3</originalsourceid><addsrcrecordid>eNrjZNBySS3IL84syczPU0gsKEgsSiwpLVZIzEtRSEFIFFcWl6Tm8jCwpiXmFKfyQmluBiU31xBnD12gwvjU4oLE5NS81JJ4Zz8jQ1NDM2MDc6PQUGOiFAEAxQsqYA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Deposition apparatus and deposition system</title><source>esp@cenet</source><creator>LINDENBERG RALPH</creator><creatorcontrib>LINDENBERG RALPH</creatorcontrib><description>Deposition apparatuses and deposition systems are described. The deposition apparatus comprises: a vacuum chamber sized to accommodate a GEN 2-generation or higher rectangular large area substrate; and an array of deposition sources having at least a first deposition source, a second deposition source, and a third deposition source, the first, second, and third deposition sources having a target pitch in a first direction, the array of deposition sources configured to deposit a material in a processing region in the vacuum chamber in a static deposition process, wherein a ratio of the deposition source pitch to the deposition source size in the first direction is 1.8 or more.
描述了沉积设备和沉积系统。所述沉积设备包括:真空腔室,所述真空腔室定大小为适于容纳GEN 2代或更高世代的矩形大面积基板;和沉积源阵列,所述沉积源阵列具有至少第一沉积源、第二沉积源和第三沉积源,所述第一沉积源、第二沉积源和第三沉积源具有在第一方向上的靶节距,所述沉积源阵列被构造为在静态沉积工艺中在真空腔室中的处理区域中沉积材料,其中在所述第一方向上沉积源节距与沉积源尺寸的比率为1.8或更大。</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211214&DB=EPODOC&CC=CN&NR=215163072U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211214&DB=EPODOC&CC=CN&NR=215163072U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LINDENBERG RALPH</creatorcontrib><title>Deposition apparatus and deposition system</title><description>Deposition apparatuses and deposition systems are described. The deposition apparatus comprises: a vacuum chamber sized to accommodate a GEN 2-generation or higher rectangular large area substrate; and an array of deposition sources having at least a first deposition source, a second deposition source, and a third deposition source, the first, second, and third deposition sources having a target pitch in a first direction, the array of deposition sources configured to deposit a material in a processing region in the vacuum chamber in a static deposition process, wherein a ratio of the deposition source pitch to the deposition source size in the first direction is 1.8 or more.
描述了沉积设备和沉积系统。所述沉积设备包括:真空腔室,所述真空腔室定大小为适于容纳GEN 2代或更高世代的矩形大面积基板;和沉积源阵列,所述沉积源阵列具有至少第一沉积源、第二沉积源和第三沉积源,所述第一沉积源、第二沉积源和第三沉积源具有在第一方向上的靶节距,所述沉积源阵列被构造为在静态沉积工艺中在真空腔室中的处理区域中沉积材料,其中在所述第一方向上沉积源节距与沉积源尺寸的比率为1.8或更大。</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBySS3IL84syczPU0gsKEgsSiwpLVZIzEtRSEFIFFcWl6Tm8jCwpiXmFKfyQmluBiU31xBnD12gwvjU4oLE5NS81JJ4Zz8jQ1NDM2MDc6PQUGOiFAEAxQsqYA</recordid><startdate>20211214</startdate><enddate>20211214</enddate><creator>LINDENBERG RALPH</creator><scope>EVB</scope></search><sort><creationdate>20211214</creationdate><title>Deposition apparatus and deposition system</title><author>LINDENBERG RALPH</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN215163072UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>LINDENBERG RALPH</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LINDENBERG RALPH</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Deposition apparatus and deposition system</title><date>2021-12-14</date><risdate>2021</risdate><abstract>Deposition apparatuses and deposition systems are described. The deposition apparatus comprises: a vacuum chamber sized to accommodate a GEN 2-generation or higher rectangular large area substrate; and an array of deposition sources having at least a first deposition source, a second deposition source, and a third deposition source, the first, second, and third deposition sources having a target pitch in a first direction, the array of deposition sources configured to deposit a material in a processing region in the vacuum chamber in a static deposition process, wherein a ratio of the deposition source pitch to the deposition source size in the first direction is 1.8 or more.
描述了沉积设备和沉积系统。所述沉积设备包括:真空腔室,所述真空腔室定大小为适于容纳GEN 2代或更高世代的矩形大面积基板;和沉积源阵列,所述沉积源阵列具有至少第一沉积源、第二沉积源和第三沉积源,所述第一沉积源、第二沉积源和第三沉积源具有在第一方向上的靶节距,所述沉积源阵列被构造为在静态沉积工艺中在真空腔室中的处理区域中沉积材料,其中在所述第一方向上沉积源节距与沉积源尺寸的比率为1.8或更大。</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN215163072UU |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL METALLURGY SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION |
title | Deposition apparatus and deposition system |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T05%3A20%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LINDENBERG%20RALPH&rft.date=2021-12-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN215163072UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |