Temperature change stress failure test device under simulated assembly of low-light-level image intensifier

The utility model discloses a temperature change stress failure test device under simulated assembly of a low-light-level image intensifier. The device comprises a rear shell, a front shell, an upper cover, a screw, a light hole, an observation hole, a cylindrical surface stress sensor, an end surfa...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHU SHICONG, WANG GUANGFAN, LI YAQING, CHU ZHUJUN, LI SHUNPING, ZHU WENJIN, LI JINSHA
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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