Temperature change stress failure test device under simulated assembly of low-light-level image intensifier

The utility model discloses a temperature change stress failure test device under simulated assembly of a low-light-level image intensifier. The device comprises a rear shell, a front shell, an upper cover, a screw, a light hole, an observation hole, a cylindrical surface stress sensor, an end surface stress sensor, a stress reading device and a torque wrench. The rear shell and the front shell are of symmetrical semicircular cylinder structures which are matched with the size of the image intensifier and are provided with positioning steps and pretightening force screw mounting holes, pretightening force is set for the cylindrical surface and the end surface of the image intensifier through screws, and the device is put on a mounting platform in a temperature change test box body and then is used for electrifying the image intensifier; the stability of the brightness of the image output by the image intensifier and the reliability of the image intensifier can be observed and monitored through the observation