Switch matrix structure for multichannel device test and test system

The utility model provides a switch matrix structure used for multichannel device test, comprising an uplink port group used for connecting test equipment and a downlink port group used for connecting a multichannel device to be tested, the uplink port group is provided with at least four first ports, and each first port is composed of a first single-pole multi-throw switch; the downlink port group is provided with at least four second ports, and each second port is composed of a second single-pole multi-throw switch; each switch arm of the same first single-pole multi-throw switch is connected with one switch arm of each second single-pole multi-throw switch; the input end of the first single-pole multi-throw switch is an external connection end of the first port, and the input end of the second single-pole multi-throw switch is an external connection end of the second port. After the structure is connected, the test system can form a plurality of different test channels, and the corresponding test channels