Optical module dynamic temperature cycle test equipment

The optical module dynamic temperature cycle test device comprises a temperature cycle test box and a bit error tester, the temperature cycle test box comprises a temperature cycle test board and a plurality of wavelength division multiplexers, and the temperature cycle test board is provided with a test light source and a plurality of tested optical modules cascaded with the test light source. The electric port transmitting and receiving ends of the test light source are correspondingly connected with the transmitting and receiving electric ports of the bit error tester; the light output interface of the test light source is connected with the light input interface of the first tested light module, and the light input interface of the test light source is connected with the light output interface of the last tested light module; the optical input interface of the current tested optical module is connected with the optical output interface of the previous tested optical module; transmitting and receiving elec