Auxiliary measurement device for reflection coefficient of shallow formation profiler
The auxiliary measuring device for the reflection coefficient of the shallow formation profiler comprises a three-dimensional experimental platform and a transducer fixed on the three-dimensional experimental platform, the transducer vertically emits sound waves upwards, the sound waves are totally...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The auxiliary measuring device for the reflection coefficient of the shallow formation profiler comprises a three-dimensional experimental platform and a transducer fixed on the three-dimensional experimental platform, the transducer vertically emits sound waves upwards, the sound waves are totally reflected by a still water surface after being propagated in water, and the reflected sound waves are received by the transducer again after being propagated in water, so that the reflection coefficient of the shallow formation profiler is measured. According to the auxiliary measuring device for the reflection coefficient of the shallow formation profiler, the open water characteristic of a deep sea engineering experimental pool and the total reflection characteristic of a still water surface are utilized, so that the measurement accuracy of the reflection coefficient of the shallow formation profiler is improved, and the measurement accuracy of the reflection coefficient of the shallow formation profiler is impro |
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