Height-adjustable drop test device
The utility model relates to a drop test device with adjustable height, and solves the technical problems of non-adjustable test height and high cost in the prior art. The device comprises an impact surface, a surrounding edge is arranged in the circumferential direction of the impact surface, a sup...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model relates to a drop test device with adjustable height, and solves the technical problems of non-adjustable test height and high cost in the prior art. The device comprises an impact surface, a surrounding edge is arranged in the circumferential direction of the impact surface, a supporting rod is vertically arranged on one side of the impact surface, a storage plate is arranged onthe supporting rod, a positioning piece capable of moving up and down along the supporting rod is arranged on one side of the storage plate, the supporting rod is sleeved with the positioning piece,and a calibrated scale is arranged on one side of the supporting rod. The drop test device has the characteristics of capability of freely adjusting the drop test height, simplicity in operation and low manufacturing cost.
本实用新型涉及一种高度可调的跌落测试装置,解决了现有技术中存在的测试高度不可调节,成本高的技术问题。本实用新型包括撞击面,在所述撞击面周向设有围边,在所述撞击面的一侧竖直设有支撑杆,在所述支撑杆上设有置物板,所述置物板一侧设有可沿着支撑杆上下移动的定位件,所述定位件套接在支撑杆上,所述支撑杆的一侧设有刻度尺。本实用新型具有能自由调节跌落测试高度,操作简单,造价低的特点。 |
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