Special sampling probe for easy-crystallization occasion

The sampling probe comprises a sampling pipe, first sliding grooves are symmetrically formed in the outer side wall of the end of an air inlet of the sampling pipe, an annular groove is formed in theend face of the sampling pipe, a second sliding groove is formed in the bottom end of each first sliding groove, a clamping groove is formed in one end of each second sliding groove, and first springsare integrally formed and symmetrically arranged at the other end of each second sliding groove. And the other end of the first spring is integrally formed and arranged on an extrusion plate, the extrusion plate is connected into a second sliding groove in a sliding mode, second springs are integrally formed and symmetrically arranged at the bottom end of an annular groove, so that the better dust and impurity removing effect is achieved, dust and impurities are cleaned very conveniently, and then the sampling work efficiency is improved. 本实用新型公开了一种易结晶场合专用取样探头，包括采样管，所述采样管进气口端部外侧壁对称设置有第一滑槽、端面设置有环形凹槽，所述第一滑槽底端设置第二滑槽，所述第二