Semiconductor chilling plate aging test fixture based on constant-temperature platform

The utility model discloses a semiconductor chilling plate aging test fixture based on a constant temperature platform. The device comprises a constant-temperature platform, a power supply, a temperature monitoring recorder and an electric control device, wherein the semiconductor chilling plate is arranged on the constant-temperature platform, the electric control device is linearly connected between the power supply and the semiconductor chilling plate to intermittently supply power to the semiconductor chilling plate, and a probe of the temperature monitoring recorder is connected with thesurface of the semiconductor chilling plate to monitor the temperature. The utility model relates to a semiconductor chilling plate aging test fixture based on a constant temperature platform. Settingof various environment temperatures is met, the test is more real, power is on for a certain period of time, then power is off for a period of time to cool the semiconductor chilling plate, the target cycle test frequency is