Semiconductor refrigeration sheet aging test device

The utility model provides a semiconductor refrigeration sheet aging test device, and relates to the technical field of semiconductor refrigeration sheets. The semiconductor refrigeration sheet agingtest device comprises a test board, a limiting assembly, a first heat conduction plate, a second heat conduction plate and a test controller. The bottom surface of the first heat conduction plate is attached to the cold surface of the refrigeration sheet to be tested; the test controller comprises a processor, a power supply, a change-over switch, a detection assembly and a timing counter, the change-over switch is arranged between the power supply and the refrigeration sheet to be tested, the detection assembly comprises a temperature sensor and a current sensor, and the input end of the current sensor is electrically connected with the refrigeration sheet. According to the utility model, through the design of the test controller, the aging test is carried out on the refrigeration sheet to be tested in an automat