Release sucker for chip aging test equipment

The utility model discloses a release sucker for chip aging test equipment, and relates to the technical field of low-cost aging test equipment. The mechanical arm comprises a mechanical arm body, a threaded connection cover is fixed to the end of the mechanical arm body, and a negative pressure channel is formed in the mechanical arm body and connected into the threaded connection cover. The sucker base pad comprises a connecting part and a sucker part; the connecting part is in threaded connection with a threaded connecting cover of the mechanical arm; the sucker part is used for sucking a chip; according to the mechanical arm, the suction head can be rapidly released, the time needed for replacing the suction head each time can be shortened, and meanwhile the problem that the cost is increased due to overall replacement of the mechanical arm is solved. 本实用新型公开了一种用于芯片老化测试设备的释放吸头，涉及低成本老化测试设备技术领域。本实用新型包括机械手臂，所述机械手臂的端部固定有螺纹连接盖，所述机械手臂上设置有负压通道，所述负压通道连接在螺纹连接盖内；还包括吸头基垫，所述吸头基垫包括用于与机械手臂的螺纹连接盖螺纹连接的连接部和用于吸取芯片的吸头部；本申请的