Semiconductor refrigeration sheet aging test device

The utility model provides a semiconductor refrigeration sheet aging test device, and relates to the technical field of semiconductor refrigeration sheets. The semiconductor refrigeration sheet agingtest device comprises a test board, a limiting assembly, a first heat conduction plate and a test controller. A limiting groove is formed in the middle of the test board, the limiting assembly comprises a first limiting plate, a first limiting assembly body and a second limiting assembly body, the first limiting assembly body comprises a driving column, a driving disc and a limiting base, a bearing groove is formed in the limiting base, and the second limiting assembly body comprises a supporting column, a second limiting plate and a limiting spring. According to the utility model, the limiting groove is designed; the effect of limiting the refrigeration sheet to be tested is achieved; the limiting and fixing effect of the refrigeration sheet to be tested is improved; through the design ofthe limiting plate, the f