A anchor clamps for test of semiconductor chip radio frequency

The utility model discloses an anchor clamps for test of semiconductor chip radio frequency, comprises a workbench, the input end is installed on the top of workstation, first splint adjuster is installed to the below of input end, first splint are installed to the below of first splint adjuster, all use the conducting resin or weld with suitable metal material in two ends of test fixture, make the end more firm with being connected of workstation, better solution on the present china's market end on prior art's the semiconductor chip radio frequency test fixture in the use easy wearing and tearing with not hard up, end on a period rear jig may drop, thereby influence test fixture's normal use's problem, five transprotable splint have been set up around the chip carrier, this can be according to the different size of different semiconductor chip and carry out real -time adjustment to the size and the size of chip carrier, test fixture's adaptability has been strengthened. 本实用新型公开了种用于半导体芯片射频测试的夹具，包括工作台，所述工作台的顶