Automatic device of test chip
The utility model relates to a test field especially relates to an automatic device of test chip. The utility model provides an automatic device of test chip, including microcontroller, the chip that awaits measuring, current detection module, first display module and analog switch chip, current det...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model relates to a test field especially relates to an automatic device of test chip. The utility model provides an automatic device of test chip, including microcontroller, the chip that awaits measuring, current detection module, first display module and analog switch chip, current detection module's one end with the chip that awaits measuring is connected, the other end with microcontroller connects, the one end of analog switch chip with the chip that awaits measuring is connected, the other end with microcontroller connects, first display module with the chip that awaits measuring is connected. The realization tries to be triggered the chip of corresponding function by external equipment's incoming signal from dynamic testing.
本实用新型涉及测试领域,尤其涉及种自动测试芯片的装置。本实用新型提供的自动测试芯片的装置,包括微控制器、待测芯片、电流检测模块、第显示模块和模拟开关芯片;所述电流检测模块的端与所述待测芯片连接,另端与所述微控制器连接;所述模拟开关芯片的端与所述待测芯片连接,另端与所述微控制器连接;所述第显示模块与所述待测芯片连接。实现自动测试由外部设备的输入信号触发对应功能的芯片。 |
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