Measure device of sphere surface blemish
The utility model provides a measure device of sphere surface blemish, includes the support, is provided with laser instrument, laser instrument one side on the support and is provided with the rotor platform on being provided with detector, support, is provided with the xy micromatic setting on the...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The utility model provides a measure device of sphere surface blemish, includes the support, is provided with laser instrument, laser instrument one side on the support and is provided with the rotor platform on being provided with detector, support, is provided with the xy micromatic setting on the rotor platform, under the xy micromatic setting is located the laser instrument, the rotor platform includes horizontal table and is fixed in the rotation axis of horizontal table bottom, and the rotation axis end is provided with the gear wheel, on little gear engagement on gear wheel and the motor spindle, xy micromatic setting are fixed in horizontal table, and with the mutual level of horizontal table, the xy micromatic setting includes slide bracket, mounting fixture, X spindle guide rail, Y spindle guide rail, and X spindle guide rail sets up on horizontal table, and the slide bracket bottom is provided with the sliding block, and sliding block and X spindle guide rail sliding connection drive slide bracket along X axle slip, the slide bracket surface is provided with Y spindle guide rail, and the mounting fixture bottom is provided with the sliding block, and sliding block and Y spindle guide rail sliding connection drive slide bracket and slide along the Y axle, and slide bracket and mounting fixture one side all are provided with pneumatic cylinder, hydraulic cylinder piston rod and slide bracket and mounting fixture rigid coupling. Operating is simplified step and flow have improved measurement accuracy greatly. |
---|