Aspheric interference detection apparatus based on sub-aperture stitching method and computer-generated hologram method

An aspheric interference detection apparatus based on a sub-aperture stitching method and a computer-generated hologram method relates to an apparatus for obtaining the roughness of the surface of an aspheric optical element by using a sub-aperture stitching method and a computer-generated hologram...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG WEIJIA, YU XUELIAN, TIAN MINGMING, ZHOU KUN, MA WENSHU, SHEN TAO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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