LCM automatic aging impact test device

The utility model relates to an LCM automatic aging impact test device comprising a clock circuit and at least one relay board. The relay board comprises a triode Q, a relay K, a resistor R2, a resistor R3, a polar capacitor C3, at least one output socket J1 and a signal generator F. The base electr...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	ZHANG CHANGTAI, SITU YONGJIAN
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY EDUCATION FREQUENCY-CHANGING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	The utility model relates to an LCM automatic aging impact test device comprising a clock circuit and at least one relay board. The relay board comprises a triode Q, a relay K, a resistor R2, a resistor R3, a polar capacitor C3, at least one output socket J1 and a signal generator F. The base electrode of the triode Q is connected with the output end of the clock circuit via the resistor R2 and is grounded via the resistor R3. The emission electrode of the triode Q is grounded. The collection electrode of the triode Q is connected with one end of a coil. The other end of the coil is respectively connected with a power supply and the positive electrode of the polar capacitor C3. The negative electrode of the polar capacitor C3 is grounded. One end of a normally-open contact is connected with the power supply, and the other end of the normally-open contact is connected with the first pin of the output socket J1. The second pin of the output socket J1 is grounded. The third pin of the output socket J1 is connected with the output end of the signal generator F. Time of an LCM aging impact test is greatly reduced and efficiency of the aging impact test is enhanced.