Chip testing alarm system

The utility model discloses a chip testing alarm system comprising a one-chip microcomputer, and an optical coupler isolation circuit, a display circuit, an alarm circuit, an indication circuit, a relay control circuit, a dial switch and a continue testing switch connected with the one-chip microcomputer; the chip testing alarm system is connected in series between a probe bench TTL interface and a testing system host TTL interface; the probe bench isolates related motion signals through the optical coupler isolation circuit, and inputs the signal to the one-chip microcomputer; the one-chip microcomputer determines a FAIL signal or PASS, and displays the signal through the display circuit. The chip testing alarm system realizes EG2001X TTL communication interface after-test dotting continuous alarm function, thus solving the poor monitoring problems in a quality testing process, and reducing testing misdetection rate, and reducing chip pricking and probe damaging rate; the whole chip testing alarm system is simple in structure, convenient in operation, and low in cost.