Positioning examination mechanism of non-contact chip card inlaying position

Disclosed is a positioning examination mechanism of a non-contact chip card inlaying position, which comprises positioning levers, positioning screws and a film template. Four positioning levers are arranged in the shape of # and include positioning transverse levers and positioning vertical levers. Positioning sheets extend from the bottom of the positioning levers and a plurality of first positioning holes are uniformly distributed on each positioning sheet. Second positioning holes, each having the same aperture as each first positioning hole's, are arranged at four corners of the film template. A plurality of position examination images in an orderly arrangement are arranged on the film template. Each positioning screw is fixed to a nut and a bolt by successively passing through one second positioning hole on the film template and the certain first positioning holes on the corresponding positioning transverse lever and positioning vertical lever. According to the utility model, the film template is directly used for positioning, and a process of preprinting position patterns in advance at an inlaying position is omitted, so that cost and working time are saved. The positioning examination mechanism is also suitable for positioning film templates with various sizes. At the same time, the positioning examination mechanism in the utility model not only has a function of positioning but also has a function of sampling.