Linear coating probe test fixture

The utility model discloses a linear coating probe test fixture. The linear coating probe test fixture comprises a probe disc, a probe and a wire coil. The probe disc comprises an upper plate layer assembly and a lower plate layer assembly, and the two plate layer assemblies are arranged at an inter...

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1. Verfasser: SU JUNMEI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The utility model discloses a linear coating probe test fixture. The linear coating probe test fixture comprises a probe disc, a probe and a wire coil. The probe disc comprises an upper plate layer assembly and a lower plate layer assembly, and the two plate layer assemblies are arranged at an interval and are supported and fixed through pillars; the probe is inserted into the probe disc from bottom to top, and the head portion of the probe extends out of the upper surface of the probe disc so as to be close to a circuit board to be tested; and the wire coil is arranged at the lower portion of the probe disc, the upper portion of the wire coil is electrically connected with the probe, and the lower portion of the wire coil is connected with a detection device through a lead. According to the utility model, by use of the rigidity of the probe itself, the structure of a conventional spring is abandoned, the structure of the linear coating probe test fixture is simple, the production cost is decreased, and the detection pinhead of the probe is greatly reduced.