Device connected with a welding rack for integrally testing circuit board

The utility model relates to a device connected with a welding rack for integrally testing a circuit board, which comprises a testing rack. The testing rack is provided with probe assemblies at positions which respectively correspond with each welding-completed circuit board. Each probe in the probe assembly is aligned with a corresponding tested pad on the circuit board. The testing rack is provided with a terminal set which is connected with all probes of all probe assemblies. Compared with the prior art, the device is advantageous in that after the circuit boards of one welding rack is welded and removed from a wave welding streamline, detachment of the circuit board one by one is not required; and before the whole welding rack is conveyed to a testing instrument, the welding rack is sleeved by the testing rack and is directly conveyed to a testing position for testing. The device has advantages of high testing efficiency, and neat and standard field.