Sample bin for measurement of fourier transform infrared spectrometer

The utility model relates to a sample bin for measurement of a fourier transform infrared spectrometer. The sample bin comprises a hard base (1), a transparent or partially transparent hard upper cover (4), a locking mechanism (5) and a hand-operated control component (6). The hard base (1) is buckled with the hard upper cover (4) in a sealing mode, a sample clip (3) is arranged in an inner cavity formed by buckling the hard base (1) and the hard upper cover (4), the hand-operated control component (6) is arranged on the hard upper cover (4) in a sealing mode, and a sample to be tested is fixed on the sample clip (3) and located on a light path (11) of the fourier transform infrared spectrometer in the process of sample spectral measurement. The locking mechanism (5) is arranged on the side edge of the hard upper cover (4) and used for fastening the hard base (1) and the hard upper cover (4) which are buckled. The sample bin completely avoids influence of the testing environment to the sample, is controlled m