Automatic test device of integrated circuit

An automatic test device of an integrated circuit comprises a test area which is located on a part of a track component and is used for testing an integrated circuit chip; and the test area is provided with a gold finger fixing device which is used for fixing a gold finger and a blocking device which is used for preventing the integrated circuit chip from moving downwards under the action of gravity. The blocking device includes: a blocking base which is arranged on the track component in the test area; a blocking needle; and a blocking shifting piece. The blocking needle is configured to move relative to the blocking base, can be operated to be abutted against the lower edge of the integrated circuit chip so as to block the integrated circuit chip; a blocking cylinder provides an actuation force to the blocking needle; the blocking shifting piece is pivotally mounted on the blocking base; one end of the blocking shifting piece is abutted against the blocking cylinder and is actuated by the blocking cylinder,