System for measuring open-circuit voltage of planar thin-film thermoelectric device
The utility model discloses a system for measuring an open-circuit voltage of a planar thin-film thermoelectric device. The system comprises a sample test rack (8), a voltage measuring device and a temperature control device. The planar thin-film thermoelectric device (19) is fixed on the sample tes...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The utility model discloses a system for measuring an open-circuit voltage of a planar thin-film thermoelectric device. The system comprises a sample test rack (8), a voltage measuring device and a temperature control device. The planar thin-film thermoelectric device (19) is fixed on the sample test rack (8), the voltage measuring device is connected with the planar thin-film thermoelectric device (19) to measure the open-circuit voltage of the planar thin-film thermoelectric device (19), and the temperature control device is connected with the planar thin-film thermoelectric device (19) to control a hot junction of the planar thin-film thermoelectric device (19) to be at a first preset temperature and a cold junction of the planar thin-film thermoelectric device (19) to be at a second preset temperature. The system of the utility model can measure the open-circuit voltage of the planar thin-film thermoelectric device, and especially can measure the change of the open-circuit voltage of the planar thin-film |
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