Life span tester for magnetic latching relays
Disclosed is a life span tester for magnetic latching relays. A test circuit in the tester comprises a 555 chip, wherein the output end of the 555 chip is separately connected with the bases of a first triode and a second triode through a fourth resistor, the collector of the second triode is connec...
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | Disclosed is a life span tester for magnetic latching relays. A test circuit in the tester comprises a 555 chip, wherein the output end of the 555 chip is separately connected with the bases of a first triode and a second triode through a fourth resistor, the collector of the second triode is connected with the base of a third triode, the collector of the third triode, the emitter of the second triode and the emitter of the first triode are connected in parallel; the collector of the first triode is connected with a power supply and the emitter of the third triode is connected with the negative electrode of the power supply; one end of a relay coil to be tested is connected with the emitter of the first triode and the other end is divided into two channels which are connected with the positive and negative electrodes of the power supply through circuits of a second capacitor and a third capacitor respectively; and the output end of the 555 chip is further connected with the negative electrode of the power sup |
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