Diode voltage aging test stand

The present utility model relates to a diode aging device, especially to a diode voltage aging test stand. The diode voltage aging test stand comprises a test stand, several groups of diode connecting columns are arranged on the test stand, the diode connecting columns are connected on two ends of an AC power supply in parallel, an AC supercharging instrument and a switch are connected between the diode connecting columns and the AC power supply. The diode voltage aging test stand also comprises a baking box simulating the high temperature environment for diodes. By adopting the above structure, voltage value of the AC power supply is enhanced to a simulated high voltage value through the AC supercharging instrument, high voltage aging of the diodes of the test stand can be realized, the whole test stand can also be placed inside the baking box, and high temperature aging of the diodes can be realized through setting the baking box to a needed high temperature value for heating.