Multi-rate compatible optical device sensitivity test device with adjustable working voltage
The utility model discloses a multi-rate compatible optical device sensitivity test device with adjustable working voltage. The multi-rate compatible optical device sensitivity test device is characterized by comprising a microprocessor, an avalanche photo-electric diode, an adjustable voltage drive...
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | The utility model discloses a multi-rate compatible optical device sensitivity test device with adjustable working voltage. The multi-rate compatible optical device sensitivity test device is characterized by comprising a microprocessor, an avalanche photo-electric diode, an adjustable voltage drive circuit for providing working voltage for the avalanche photo-electric diode, and a multi-rate clock chip for providing a multi-rate clock for the test device, wherein the avalanche photo-electric diode and the multi-rate clock chip are connected with the microprocessor; and the adjustable voltage drive circuit is formed by connecting a double-path temperature control resistor and a DC-DC converter, and the control end of the double-path temperature control resistor is connected with the microprocessor. The test device has good compatibility, the working voltage is adjustable and automatic measurement can be realized. |
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