Method and system for generating length deviation statistics, and method and system using same
A method for generating length deviation statistics utilized for controlling operation of an optical storage device, includes: detecting a plurality of pattern lengths, each pattern length corresponding to data on an optical storage medium accessed by the optical storage device; and performing calcu...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A method for generating length deviation statistics utilized for controlling operation of an optical storage device, includes: detecting a plurality of pattern lengths, each pattern length corresponding to data on an optical storage medium accessed by the optical storage device; and performing calculations according to the pattern lengths to generate length deviation statistics associated with the pattern lengths. |
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