Method for determining the thickness of a layer of electroconductive material in a contactless manner

The invention relates to a method for determining the thickness of a layer (20) of electroconductive material of a component (17) in a contactless manner. This is achieved by a sensor having a coil body (13) and a coil (14), said sensor being positioned in proximity to the component (17) to be measured. The inventive method is based on a combination of the inductive and eddy current principle. Several measuring and evaluation steps, consisting in a first alternating current frequency (f1) and a second alternating current frequency (f2) being applied to the coil (14) and its change in inductance being evaluated, are performed in order to determine the thickness of the layer (20). The distance between the coil body (13), i.e. the coil (14), and the component (17) is thus derived from the inductance value of the coil (14) to which the second alternating current frequency (f2) had been applied.