Pick and place machine with component placement inspection
Improved component placement inspection and verification is performed by a pick and place machine. Improvements include: stereovision imaging of the intended placement location; enhanced illumination to facilitate the provision of relatively high-power illumination in the restricted space near the p...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | Improved component placement inspection and verification is performed by a pick and place machine. Improvements include: stereovision imaging of the intended placement location; enhanced illumination to facilitate the provision of relatively high-power illumination in the restricted space near the placement nozzle(s); optics to allow image acquisition device to view the placement location from an angle relative to a plane of the placement location, thereby reducing the possibility of such images being obstructed by the component; techniques for rapidly acquiring images with commercially available CCD arrays such that acquisition of before and after images does not substantially impact system throughput; and image processing techniques to provide component inspection and verification information. |
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