Semiconductor element with nickel silicide and method for preparing nickel silicide
The method includes following steps: first, supplying a semiconductor substrate of including multiple doping areas; next, forming a nickel layer on the said semiconductor substrate, and then carrying out a first heat treatment in quick speed to make the nickel layer act on the doping areas below; th...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The method includes following steps: first, supplying a semiconductor substrate of including multiple doping areas; next, forming a nickel layer on the said semiconductor substrate, and then carrying out a first heat treatment in quick speed to make the nickel layer act on the doping areas below; then, removing unreacted nickel layer, and carrying out a second heat treatment in quick speed in order to form semiconductor elements of possessing silicide of nickel. The second heat treatment in quick speed includes a process of spike anneal under temperature between 400 to 600 deg.C. |
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