Method and device for accurately positioning a pattern on a substrate

A printing machine comprises an X-Y table ( 50 ) for moving a substrate ( 30 ) with respect to a print head ( 20 ). During a printing process, the substrate ( 30 ) is moved, whereas the print head ( 20 ) is intermittently activated to fire ink droplets. A camera ( 25 ) is arranged for providing imag...

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Bibliographische Detailangaben
1. Verfasser:	VAN DAM DIRKJAN B.,VAN DEN BESSELAAR LEONARDUS J
Format:	Patent
Sprache:	eng
Schlagworte:	APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY CORRECTION OF TYPOGRAPHICAL ERRORS ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME LINING MACHINES MATERIALS THEREFOR ORIGINALS THEREFOR PERFORMING OPERATIONS PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS PRINTING SELECTIVE PRINTING MECHANISMS SEMICONDUCTOR DEVICES STAMPS TRANSPORTING TYPEWRITERS
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Beschreibung
Zusammenfassung:	A printing machine comprises an X-Y table ( 50 ) for moving a substrate ( 30 ) with respect to a print head ( 20 ). During a printing process, the substrate ( 30 ) is moved, whereas the print head ( 20 ) is intermittently activated to fire ink droplets. A camera ( 25 ) is arranged for providing images of the substrate ( 30 ) to a computer which is programmed to recognize patterns. In order for the print head ( 20 ) to be able to print a spot at a predetermined position on the substrate ( 30 ), an offset between a predetermined and an actual mutual position of the substrate ( 30 ) and the print head ( 20 ) is measured and compensated for. For the purpose of measuring this offset, a test spot ( 38 ) is printed on the substrate ( 30 ) and an offset between a predetermined and an actually obtained position of this test spot ( 38 ) is measured by means of pattern recognition.