Method of determining physical properties of an optical layer or layer system

The method involves selecting a reference wavelength dependent refractive index value and a reference extinction coefficient value. A refractive index and an extinction coefficient value for an optical layer are measured. A wavelength-independent refractive index variation constant and a wavelength-...

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Bibliographische Detailangaben
1. Verfasser:	LOTZ HANS-GEORG DR,SCHROEDER JUERGEN
Format:	Patent
Sprache:	eng
Schlagworte:	APPARATUS SPECIALLY ADAPTED THEREFOR CALCULATING CINEMATOGRAPHY COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTROGRAPHY HOLOGRAPHY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MATERIALS THEREFOR MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The method involves selecting a reference wavelength dependent refractive index value and a reference extinction coefficient value. A refractive index and an extinction coefficient value for an optical layer are measured. A wavelength-independent refractive index variation constant and a wavelength-independent extension coefficient variation constant are calculated based on specific equations. An independent claim is also included for a non-volatile storage medium containing computer Software encoded in a machine readable format.