Method for cleaning sic particles

Method for cleaning of silicon carbide particles from fine grain particles adhering to said silicon carbide particles, typically in the form of agglomerates of metal particles, subsequent to production (cutting) of silicon wafers and after removal of any present solute or dispersing agent from the p...

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1. Verfasser: RAANESS OLA SCHIEFLOE,CHMELAR JURAJ
Format: Patent
Sprache:eng
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Zusammenfassung:Method for cleaning of silicon carbide particles from fine grain particles adhering to said silicon carbide particles, typically in the form of agglomerates of metal particles, subsequent to production (cutting) of silicon wafers and after removal of any present solute or dispersing agent from the particles. The particles (1) of contaminated silicon carbide are firstly exposed to a mechanical treatment in a first step (2) of cleaning in a per se known classifying apparatus where a first coarse fraction (3) of particles, agglomerates, larger than the original silicon carbide particles, are separated out and treated in a process (4) where the agglomerates are broken down to individual grains, without crushing said individual grains, and thereafter recycled (5) to said first step (2) of cleaning. A first fine fraction (6) is discharged from said first step (2) and transferred to a second step (7) of cleaning conducted in a per se known classifying apparatus from which the particles of silicon carbide are discharged in the form of a second coarse fraction (8), while the contaminants separated out in said second step of cleaning, are discharged in the form of a second fine fraction (9).