Semiconductor device

The degree of integration and the number of rewriting of a semiconductor device having a nonvolatile memory element are improved. A first MONOS nonvolatile-memory-element and a second MONOS nonvolatile-memory-element having a large gate width compared with the first MONOS nonvolatile-memory-element...

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Bibliographische Detailangaben
1. Verfasser: ITO FUMITOSHI,KAWASHIMA YOSHIYUKI,SAKAI TAKESHI,ISHII YASUSHI,KANAMARU YASUHIRO,HASHIMOTO TAKASHI,MIZUNO MAKOTO,OKUYAMA KOUSUKE,MANABE YUKIKO
Format: Patent
Sprache:eng
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Zusammenfassung:The degree of integration and the number of rewriting of a semiconductor device having a nonvolatile memory element are improved. A first MONOS nonvolatile-memory-element and a second MONOS nonvolatile-memory-element having a large gate width compared with the first MONOS nonvolatile-memory-element are mounted together on the same substrate, and the first MONOS nonvolatile-memory-element is used for storing program data which is scarcely rewritten, and the second MONOS nonvolatile-memory-element is used for storing processed data which is frequently rewritten.